Sensor coupling apparatus

摘要

An inspection apparatus for nondestructive inspection/evaluation. The inspection apparatus may include a probe, and sensor, and a biasing spring. The probe may have a first end and a second, free end defining an opening. The sensor may be received in the opening. The biasing spring may be received in the opening in between the first end of the probe and the sensor to urge the sensor away from the first end of the probe. The probe may include a gimbal joint or ball and socket type joint and a spindle, where the joint provides for deflection of the probe relative to the spindle. A blocking pin for limiting the range of movement of the sensor retains part of the sensor in the opening. The sensor may have a position extending out of the opening, and a position where an end of the sensor is substantially flush with the end of the probe.

主权项

1. An inspection apparatus, comprising:
a probe having a longitudinal axis, a first end, and a second, free end defining an opening, wherein the opening is offset from the longitudinal axis; a sensor for inspecting a target and providing an electrical output, the sensor received in the opening, wherein when the probe is rotated about the longitudinal axis the sensor moves in a substantially circular path; and bias means received in the opening in between the first end of the probe and the sensor to urge the sensor away from the first end of the probe.