发明名称 DATA PROCESSING DEVICE AND AUTOMATIC ANALYSIS DEVICE USING SAME
摘要 An automatic analysis device includes: a factor storage unit 12b which stores each factor previously specified as a factor that could affect measurement accuracy of each of measurement items, while associating each factor with each measurement item; an abnormality judgment unit 103a which judges the presence/absence of an abnormality in a measurement value of each measurement item on the basis of an approximation formula and approximation formula parameters stored in an approximation formula storage unit 12a; and a factor judgment unit 103b which refers to the results of the judgment by the abnormality judgment unit 103a in a preset order, and would judge as an abnormality factor a factor stored in the factor storage unit 12b in association with a measurement item as an abnormality factor in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal. The operator is informed of the abnormality factor on the basis of the result of the judgment by the factor judgment unit 103b. With this configuration, deterioration in the measurement accuracy can be reduced through the detection of an abnormality in the measurement result and the determination of the causative factor.
申请公布号 US2015198579(A1) 申请公布日期 2015.07.16
申请号 US201314417841 申请日期 2013.07.03
申请人 Hitachi High-Technologies Corporation 发明人 Ishii Naomi;Kamihara Kumiko
分类号 G01N33/483;G01N1/00 主分类号 G01N33/483
代理机构 代理人
主权项 1. A data processing device comprising: an approximation formula storage unit which stores an approximation formula of time-variation of a measurement value regarding each of measurement items and parameters specifying the approximation formula in regard to each measurement item; a factor storage unit which stores each factor previously specified as a factor that could affect measurement accuracy of each of the measurement items, while associating each factor with each measurement item; an abnormality judgment unit which judges the presence/absence of an abnormality in the measurement value of each measurement item on the basis of the approximation formula and the parameters of the approximation formula; a factor judgment unit which refers to a result of the judgment by the abnormality judgment unit in a preset order of measurement objects, and would judge as an abnormality factor a factor stored in the factor storage unit in association with a measurement item in a case where a plurality of measurement values regarding the measurement item have consecutively been judged to be abnormal; and a notification unit which notifies an operator of the abnormality factor on the basis of the result of the judgment by the factor judgment unit.
地址 Tokyo JP