| 摘要 |
<p>Systems, methods, and media for performing shape measurement are provided. In some embodiments, systems for performing shape measurement are provided, the systems comprising: a projector that projects onto a scene a plurality of illumination patterns, wherein each of the illumination patterns has a given frequency, each of the illumination patterns is projected onto the scene during a separate period of time, three different illumination patterns are projected with a first given frequency, and only one or two different illumination patterns are projected with a second given frequency; a camera that detects an image of the scene during each of the plurality of periods of time; and a hardware processor that is configured to: determine the given frequencies of the plurality of illumination patterns; and measure a shape of an object in the scene.</p> |
