| 摘要 |
Provided is a semiconductor device which is capable of reducing the concentration of stress on the corners of a bonding portion to suppress or prevent the occurrence of a crack in a solder layer in, for example, a temperature cycle reliability test and a method of manufacturing the same. The semiconductor device according to the invention has a connection structure in which a semiconductor chip (3) is mounted on an insulating substrate (1) having conductor patterns (2a, 2b) bonded to both surfaces thereof and the insulating substrate (1) is bonded to a heat-dissipating base member (4) such that heat generated from the semiconductor chip (3) can be dissipated to the outside. Of the conductor patterns (2a, 2b), the conductor pattern (2b) bonded to the heat-dissipating base member (4) is formed such that the thickness of the circumference of a bonding portion to the insulating substrate (1) is less than that of the center of the bonding portion. As a result, it is possible to form a fixing layer made of, for example, solder such that the thickness of an outer circumferential portion is more than that of the bonding portions of the conductor patterns (2a, 2b). |
