INTEGRATED RF MEMS ON ATE LOADBOARDS FOR SMART SELF RF MATCHING

摘要

In a testing device, a method for implementing automatic RF port testing is disclosed. The method includes the steps of: attaching a device to be tested having a plurality of RF pins to a load board; dynamically tuning a plurality of RF ports of the load board to the RF pins; and automatically matching the RF ports to the RF pins with respect to impedance. The method further includes a step of implementing an RF port testing process on the device to be tested.