发明名称 |
Memory cells having a common gate terminal |
摘要 |
Arrays of memory cells having a common gate terminal and methods of operating and forming the same are described herein. As an example, an array of memory cells may include a group of memory cells each having a resistive storage element coupled to a select device. Each select device includes a first terminal, a second terminal, and a gate terminal, where the gate terminal is common to each memory cell of the group. |
申请公布号 |
US9082494(B2) |
申请公布日期 |
2015.07.14 |
申请号 |
US201213350061 |
申请日期 |
2012.01.13 |
申请人 |
Micron Technology, Inc. |
发明人 |
Gupta Rajesh N.;Nemati Farid |
分类号 |
G11C11/00;G11C11/16;H01L45/00;H01L27/22;H01L27/24 |
主分类号 |
G11C11/00 |
代理机构 |
Brooks, Cameron & Huebsch, PLLC |
代理人 |
Brooks, Cameron & Huebsch, PLLC |
主权项 |
1. An array of memory cells, comprising:
a group of memory cells, each including a resistive storage element coupled to a select device, wherein the group includes at least three memory cells such that at least two of the three memory cells are physically connected to a first sense line and at least two of the three memory cells are physically connected to a first access line; wherein each select device includes a base semiconductor material, a first terminal, a second terminal, and a gate terminal; and wherein the gate terminal of each select device is formed from a continuous gate terminal material that surrounds each of the base semiconductor materials, and wherein the gate terminal of each select device is common to each memory cell of the group. |
地址 |
Boise ID US |