发明名称 Memory cells having a common gate terminal
摘要 Arrays of memory cells having a common gate terminal and methods of operating and forming the same are described herein. As an example, an array of memory cells may include a group of memory cells each having a resistive storage element coupled to a select device. Each select device includes a first terminal, a second terminal, and a gate terminal, where the gate terminal is common to each memory cell of the group.
申请公布号 US9082494(B2) 申请公布日期 2015.07.14
申请号 US201213350061 申请日期 2012.01.13
申请人 Micron Technology, Inc. 发明人 Gupta Rajesh N.;Nemati Farid
分类号 G11C11/00;G11C11/16;H01L45/00;H01L27/22;H01L27/24 主分类号 G11C11/00
代理机构 Brooks, Cameron & Huebsch, PLLC 代理人 Brooks, Cameron & Huebsch, PLLC
主权项 1. An array of memory cells, comprising: a group of memory cells, each including a resistive storage element coupled to a select device, wherein the group includes at least three memory cells such that at least two of the three memory cells are physically connected to a first sense line and at least two of the three memory cells are physically connected to a first access line; wherein each select device includes a base semiconductor material, a first terminal, a second terminal, and a gate terminal; and wherein the gate terminal of each select device is formed from a continuous gate terminal material that surrounds each of the base semiconductor materials, and wherein the gate terminal of each select device is common to each memory cell of the group.
地址 Boise ID US