发明名称 Particle beam scanning irradiation system
摘要 A particle beam scanning irradiation method includes the steps of calculating a planned irradiating particle count of a particle beam for each of irradiation spots, on the basis of a relative amount of particle beam irradiation and a prescription particle-beam dose determined from a particle-beam therapy plan; simulating an irradiation process of the particle beam at each irradiation spot, on the basis of the planned irradiating particle count and a beam current waveform of the particle beam, and calculating a particle count of the particle beam irradiating the diseased portion during a scan shift of the particle beam; correcting the planned irradiating particle count for each irradiation spot by using the irradiating particle count during the scan shift; converting the corrected planned-irradiation particle count into a count value used in a dose monitor; and irradiating the irradiation spot with the particle beam, on the basis of the converted count value.
申请公布号 US9079026(B2) 申请公布日期 2015.07.14
申请号 US201214386626 申请日期 2012.03.21
申请人 MITSUBISHI ELECTRIC CORPORATION 发明人 Pu Yuehu;Ikeda Masahiro;Honda Taizo
分类号 A61N5/10 主分类号 A61N5/10
代理机构 Buchanan Ingersoll & Rooney PC 代理人 Buchanan Ingersoll & Rooney PC
主权项 1. A particle beam scanning irradiation system comprising: a computer that calculates a planned irradiating particle count of a particle beam for each of a plurality of irradiation spots, on the basis of a particle-beam therapy plan; and a particle beam irradiation device that irradiates a diseased portion with the particle beam, wherein the computer simulates an irradiation process of the particle beam at each irradiation spot, on the basis of the planned irradiating particle count and a beam current waveform of the particle beam, and executes a first step of calculating a particle count of the particle beam irradiating the diseased portion during a scan shift of the particle beam; a second step of correcting the planned irradiating particle count for each irradiation spot by using the irradiating particle count during the scan shift, wherein the second step includes calculations of subtracting half the irradiating particle count during the scan shift from a planned irradiating particle count for an irradiation spot before the scan shift and from a planned irradiating particle count for an irradiation spot after the scan shift; and a third step of converting the corrected planned-irradiating particle count into a count value used in a dose monitor, and the particle beam irradiation device irradiates the diseased portion with the particle beam, on the basis of the count value converted in the third step.
地址 Chiyoda-Ku, Tokyo JP