发明名称 TEST SAMPLE TREATING APPARATUS, AND RACK
摘要 PROBLEM TO BE SOLVED: To provide a test sample treating apparatus and a rack that can help simplify otherwise complex input manipulations by operators.SOLUTION: Racks R1 to R6 hold a plurality of one type of test sample containers T1 to T3. On the under face side of each of the racks R1 to R6, a projection Re is disposed to match the type of the test sample container held by the rack. To a rack set unit 300, the racks R1 to R6 are detachably set. A container transferring unit takes out test sample containers from racks set in the rack set unit 300 and transfers them. Sensors 341 to 343 detect the projections Re set in the rack set unit 300. On the basis of detection signals from the sensors 341 to 343, the actions of the container transferring unit are controlled.
申请公布号 JP2015127640(A) 申请公布日期 2015.07.09
申请号 JP20130272556 申请日期 2013.12.27
申请人 SYSMEX CORP 发明人 NAGAI TAKAAKI;FUKUMA DAIGO;YAMAZAKI ATSUO;NAKANISHI TOSHIJI;YAO SHUNSUKE
分类号 G01N35/02 主分类号 G01N35/02
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