发明名称 ACTINIC RAY-SENSITIVE OR RADIATION-SENSITIVE RESIN COMPOSITION, RESIST FILM USING THE SAME, PATTERN FORMING METHOD, AND METHOD FOR MANUFACTURING ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an actinic ray-sensitive or radiation-sensitive resin composition from which such a hole pattern can be formed with good dependency of a developing time, that has an ultrafine pore diameter (e.g. 60 nm or less) and superior circularity, and to provide a resist film using the composition, a pattern forming method, a method for manufacturing an electronic device, and an electronic device.SOLUTION: The actinic ray-sensitive or radiation-sensitive resin composition comprises: (P) a resin having a repeating unit (a) represented by general formula (I); and (B) a compound that generates an organic acid by irradiation with actinic rays or radiation. The content of the compound (B) with respect to the whole solid content of the actinic ray-sensitive or radiation-sensitive resin composition is 8.0 mass% or more. A resist film using the above composition, a pattern forming method, a method for manufacturing an electronic device, and an electronic device are also disclosed. In general formula (I), Rrepresents a hydrogen atom or a methyl group; and R, Rand Reach independently represent a linear or branched alkyl group.
申请公布号 JP2015127827(A) 申请公布日期 2015.07.09
申请号 JP20150049584 申请日期 2015.03.12
申请人 FUJIFILM CORP 发明人 YOSHINO FUMIHIRO;TAKAHASHI HIDETOMO;YAMAGUCHI SHUHEI;KATAOKA SHOHEI;SHIRAKAWA MICHIHIRO;SAITO SHOICHI
分类号 G03F7/038;C08F220/36;G03F7/004;G03F7/039;G03F7/32 主分类号 G03F7/038
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