发明名称 PERMUTATIONAL MEMORY CELLS
摘要 Various embodiments include at least one resistance change memory (RCM) cell, In one embodiment, three or more pairs of electrical contacts are coupled to the at least one RCM cell. A first portion of the pairs are arranged laterally to one another in a first grouping and a second opposing portion of the pairs are arranged laterally to one another in a second grouping. A memory cell material is disposed between opposing sides of the pairs of the three or more electrical contacts. The memory cell material is configured to form a conductive pathway between one or more of the pairs, with each of the three or more pairs being configured to be accessed individually for at least one operation including program, erase, and read operations. Additional apparatuses and methods are described.
申请公布号 US2015194211(A1) 申请公布日期 2015.07.09
申请号 US201514665794 申请日期 2015.03.23
申请人 Micron Technology, Inc. 发明人 Sills Scott E.
分类号 G11C13/00 主分类号 G11C13/00
代理机构 代理人
主权项 1. An apparatus, comprising: at least one resistance change memory (RCM) cell; three or more pairs of electrical contacts coupled to the at least one RCM cell, a first portion of the pairs being arranged laterally to one another in a first grouping and a second opposing portion of the pairs being arranged laterally to one another in a second grouping; and a memory cell material disposed between opposing sides of the pairs of the three or more electrical contacts, the memory cell material being configured to form a conductive pathway between one or more of the pairs, each pair of the three or more pairs being configured to be accessed individually.
地址 Boise ID US