发明名称 |
CLOSED LOOP DYNAMIC CAPACITANCE MEASUREMENT |
摘要 |
This disclosure provides systems, methods and apparatus for measuring capacitance of a display unit, such as an interferometric modulator (IMOD). In one example, a circuit may include an operational amplifier (op-amp), a voltage controlled current source, and feedback from an output of the op-amp as an input to the voltage controlled current source. An output of the voltage controlled current source may be provided to a display unit as well as an input of the op-amp. A second input of the op-amp may be provided a ramping reference voltage. |
申请公布号 |
WO2015102710(A2) |
申请公布日期 |
2015.07.09 |
申请号 |
WO2014US59734 |
申请日期 |
2014.10.08 |
申请人 |
QUALCOMM MEMS TECHNOLOGIES, INC. |
发明人 |
VAN LIER, WILHELMUS JOHANNES ROBERTUS;KAWAMOTO, ROBERT STEVEN;EDGAR, JAMES STEVEN;VARMA, PRAMOD KUMAR |
分类号 |
G09G3/34 |
主分类号 |
G09G3/34 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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