发明名称 Transmission device and method of testing transmission characteristic of DUT
摘要 There is provided a transmission device. The transmission device includes: an adapter device (11) including: a first surface having a plurality of first terminals (21) thereon; and a second surface opposite to the first surface and having a plurality of second terminals (22) thereon, wherein a pitch between the adjacent second terminals is different from a pitch between the adjacent first terminals, a plurality of signal lines each electrically connecting a corresponding one of the first terminals and a corresponding one of the second terminals; and a signal compensation device (12) connected to the adapter device through the signal lines and configured to compensate for a transmission loss of a signal path between the corresponding first terminal and the corresponding second terminal such that the transmission loss is set to a given value.
申请公布号 US9075097(B2) 申请公布日期 2015.07.07
申请号 US201213408232 申请日期 2012.02.29
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD. 发明人 Kobayashi Shigeki
分类号 G01R31/00;G01R35/00;G01R31/28;G01R1/04 主分类号 G01R31/00
代理机构 Rankin, Hill & Clark LLP 代理人 Rankin, Hill & Clark LLP
主权项 1. A transmission device for correcting a transmission characteristic of a DUT (device under test), the transmission device comprising: an adapter device comprising: a first surface having a plurality of first terminals thereon, wherein the first terminals are configured to be connected to respective probe terminals of a probe card; anda second surface opposite to the first surface and having a plurality of second terminals thereon, wherein the second terminals are configured to be connected to respective socket terminals of a socket, and a pitch between the adjacent second terminals is different from a pitch between the adjacent first terminals, a plurality of signal lines each electrically connecting a corresponding first terminal and a corresponding second terminal; and an electrical signal compensation device connected to the adapter device through the signal lines and configured to compensate for a transmission loss of an electrical signal path between the corresponding first terminal and the corresponding second terminal such that the transmission loss is set to a given value, wherein the transmission characteristic of the DUT is corrected based on the transmission loss, the DUT includes: terminals configured to be physically connected to the respective probe terminals of the probe card, andother terminals configured to be physically connected to the respective socket terminals of the socket, and the adapter is interchanged with the DUT for correcting the transmission characteristic of the DUT.
地址 Nagano-Shi JP