发明名称 |
HIGH RESOLUTION HETERODYNE INTERFEROMETRIC METHOD AND SYSTEM |
摘要 |
<p>A high resolution heterodyne interferometric method and system are provided. The invention uses two parallel beams (8, 9) with different frequencies and the two parallel beams are oriented in diagonal position in the incident plane of the beam splitter (1); the invention generates two measurement signal with opposite Doppler shift. The structure is also balance. The measurement is insensitive to the thermal variation, and the periodic nonlinearity is essentially eliminated by using two separated beams. Therefore, the resolution is two times higher than the traditional interferometer.</p> |
申请公布号 |
WO2015096279(A1) |
申请公布日期 |
2015.07.02 |
申请号 |
WO2014CN72819 |
申请日期 |
2014.03.03 |
申请人 |
HARBIN INSTITUTE OF TECHNOLOGY |
发明人 |
TAN, JIUBIN;HU, PENGCHENG;CHEN, PENG |
分类号 |
G01B9/02;G01B11/02 |
主分类号 |
G01B9/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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