发明名称 PARTIAL SACRIFICIAL DUMMY GATE WITH CMOS DEVICE WITH HIGH-K METAL GATE
摘要 A gate structure in a semiconductor device includes: a gate stack formed on a substrate with three sections, a bottom portion, a top portion, and a sacrificial cap layer over the top portion; gate spacers, source and drain regions, a nitride encapsulation over top and sidewalls of the gate stack after removal of the sacrificial cap layer, an organic planarizing layer over the nitride encapsulation, planarizing the encapsulation, and silicidation performed over the source and drain regions and the bottom portion after removal of the nitride encapsulation, the organic planarizing layer, and the top portion of the gate stack.
申请公布号 US2015187897(A1) 申请公布日期 2015.07.02
申请号 US201514657723 申请日期 2015.03.13
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 Guo Dechao;Haensch Wilfried E.;Han Shu-jen;Jaeger Daniel J;Lu Yu;Wong Keith Kwong Hon
分类号 H01L29/423;H01L29/49 主分类号 H01L29/423
代理机构 代理人
主权项 1. A gate structure in a semiconductor device, comprising: a patterned gate stack formed on a substrate, said patterned gate stack comprising: a bottom portion, a top portion, and a sacrificial cap layer over the top portion; gate spacers disposed on vertical sidewalls of the gate stack; source and drain regions on opposite sides of the gate spacers; a nitride encapsulation over top and sidewalls of the gate stack after removal of the sacrificial cap layer; an organic planarizing layer over the nitride encapsulation, planarizing said nitride encapsulation, thus protecting the source and drain regions; silicidation performed over the source and drain regions and the bottom portion after removal of the nitride encapsulation, the organic planarizing layer, and the top portion of the gate stack.
地址 Armonk NY US