发明名称 |
Self aligned patterning with multiple resist layers |
摘要 |
A method for using self aligned multiple patterning with multiple resist layers includes forming a first patterned resist layer onto a substrate, forming a spacer layer on top of the first patterned resist layer such that spacer forms on side walls of features of the first resist layer, and forming a second patterned resist layer over the spacer layer and depositing a masking layer. The method further includes performing a planarizing process to expose the first patterned resist layer, removing the first resist layer, removing the second resist layer, and exposing the substrate. |
申请公布号 |
US9069249(B2) |
申请公布日期 |
2015.06.30 |
申请号 |
US201313757137 |
申请日期 |
2013.02.01 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Shieh Ming-Feng;Hsieh Ken-Hsien;Chang Shih-Ming;Lai Chih-Ming;Liu Ru-Gun |
分类号 |
G03F7/20 |
主分类号 |
G03F7/20 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method for fabricating an integrated circuit, the method comprising:
forming a first patterned resist layer onto a substrate; forming a spacer layer over the first patterned resist layer such that spacer forms on side walls of features of the first patterned resist layer; forming a second patterned resist layer over the spacer layer and depositing a masking layer; removing a portion of the second patterned resist layer to expose the first patterned resist layer; removing the remaining first and second resist layers; and exposing the substrate. |
地址 |
Hsin-Chu TW |