发明名称 Self aligned patterning with multiple resist layers
摘要 A method for using self aligned multiple patterning with multiple resist layers includes forming a first patterned resist layer onto a substrate, forming a spacer layer on top of the first patterned resist layer such that spacer forms on side walls of features of the first resist layer, and forming a second patterned resist layer over the spacer layer and depositing a masking layer. The method further includes performing a planarizing process to expose the first patterned resist layer, removing the first resist layer, removing the second resist layer, and exposing the substrate.
申请公布号 US9069249(B2) 申请公布日期 2015.06.30
申请号 US201313757137 申请日期 2013.02.01
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Shieh Ming-Feng;Hsieh Ken-Hsien;Chang Shih-Ming;Lai Chih-Ming;Liu Ru-Gun
分类号 G03F7/20 主分类号 G03F7/20
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method for fabricating an integrated circuit, the method comprising: forming a first patterned resist layer onto a substrate; forming a spacer layer over the first patterned resist layer such that spacer forms on side walls of features of the first patterned resist layer; forming a second patterned resist layer over the spacer layer and depositing a masking layer; removing a portion of the second patterned resist layer to expose the first patterned resist layer; removing the remaining first and second resist layers; and exposing the substrate.
地址 Hsin-Chu TW