MICROSCOPE AND SPIM MICROSCOPY INSPECTION METHOD

摘要

PROBLEM TO BE SOLVED: To provide a selective plane illumination microscope inspection (SPIM) method that includes an improved registration method. ! SOLUTION: A selective plane illumination microscope inspection (SPIM) method is configured to: displace a sample P in an optical axis direction of an objective lens to detect different sample planes by sheet light; carry out an illumination of the sample at least at first and second illumination angles; detect a plurality of sample planes at respective illumination angles; store the sample planes as at least first and second image stacks ST1 and ST2; perform a mutual alignment of the image stacks by aligning coordinate systems of all image stacks with a coordinate system of the first image stack ST1; combine the image stacks into one image stack; project a three-dimensional image stack to a two-dimensional display; align positions of sample characteristics captured from different illumination directions with each other; determine a coordinate transformation f