发明名称 Magnetic recording medium and method of manufacturing the same, and magnetic record/reproduction apparatus
摘要 According to the present invention, a magnetic recording medium is provided including a disk-shaped non-magnetic substrate and at least a perpendicular magnetic layer formed on the disk-shaped non-magnetic substrate, wherein the perpendicular magnetic layer has a structure in which an FePt or CoPt nanoparticle array is formed on a formation surface, on which a plurality of striations each having a circumferential directional component are formed, by a texturing treatment; a manufacturing method thereof; and a magnetic record/reproduction apparatus including the magnetic recording medium or a magnetic recording medium manufactured according to the manufacturing method.
申请公布号 US9064520(B2) 申请公布日期 2015.06.23
申请号 US201213478739 申请日期 2012.05.23
申请人 SHOWA DENKO K.K.;WASEDA UNIVERSITY 发明人 Osaka Tetsuya;Sugiyama Atsushi;Hachisu Takuma;Shige Tomoo;Fukushima Masato;Yamane Akira;Sakawaki Akira
分类号 G11B5/706;G11B5/82;G11B5/73;G11B5/66;G11B5/65;G11B5/84 主分类号 G11B5/706
代理机构 Sughrue Mion, PLLC 代理人 Sughrue Mion, PLLC
主权项 1. A method of manufacturing a magnetic recording medium comprising a disk-shaped non-magnetic substrate and at least a perpendicular magnetic layer formed on the disk-shaped non-magnetic substrate, the method comprising the steps of: applying a texturing treatment to a formation surface, on which the perpendicular magnetic layer is formed, to form a plurality of striations each having a circumferential directional component on the formation surface, said texturing treatment is performed by pressing a texturing tape onto the surface of the non-magnetic substrate while dripping a polishing solution; bringing a dispersion of FePt or CoPt nanoparticles dispersed by a dispersant into contact with an entire surface of the formation surface subjected to the texturing treatment to form an FePt or CoPt nanoparticle array that serves as the perpendicular magnetic layer on the formation surface, wherein a surface roughness of the non-magnetic substrate subjected to the texturing treatment is set to fall within a range of 0.15 to 1 nm in center line average roughness (Ra) and a distance between the adjacent striations is set to fall within a range of 10 to 20 nm, and sequentially stacking a soft magnetic underlayer and an intermediate layer that serves as the formation surface between the non-magnetic subtrate and the perpendicular magnetic layer wherein said texturing treatment is applied to a surface of the intermediate layer after a sputtering treatment.
地址 Tokyo JP