发明名称 ELECTRIC FIELD ENHANCEMENT ELEMENT, ANALYSIS DEVICE, AND ELECTRONIC DEVICE
摘要 PROBLEM TO BE SOLVED: To provide an electric field enhancement element which can be applied to many kinds of target substances because of its wide wavelength region in which the degree of enhancement is large and is capable of SARS measurement of the target substance with high sensitivity. ! SOLUTION: An electric field enhancement element according to the present invention includes a metal layer, a dielectric layer formed on the metal layer, a recess formed on the dielectric layer, a first metal particle formed inside the recess, and a second metal particle formed inside the recess apart from the first metal particle and having different material quality than the material quality of the first metal particle, a distance between the bottom face of the recess and the metal layer being 20 nm and over to less than 100 nm. ! COPYRIGHT: (C)2015,JPO&INPIT
申请公布号 JP2015114219(A) 申请公布日期 2015.06.22
申请号 JP20130256723 申请日期 2013.12.12
申请人 SEIKO EPSON CORP 发明人 ENARI MEGUMI
分类号 G01N21/65 主分类号 G01N21/65
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