发明名称 METHODS OF FORMING METAL ON INHOMOGENEOUS SURFACES AND STRUCTURES INCORPORATING METAL ON INHOMOGENEOUS SURFACES
摘要 <p>The disclosed technology relates to integrate circuits, including memory devices. A method of forming an integrated circuit comprises providing a surface comprising a first region and a second region, wherein the first region is formed of a different material than the second region. The method additionally comprises forming a seeding material in contact with and across the first and second regions. The method further comprises forming a metal comprising tungsten on the seeding material.</p>
申请公布号 WO2015088921(A1) 申请公布日期 2015.06.18
申请号 WO2014US68916 申请日期 2014.12.05
申请人 MICRON TECHNOLOGY, INC. 发明人 CHAN, TSZ, WAH;HU, YONGJUN, J.;LENGADE, SWAPNIL
分类号 H01L21/28;H01L21/203;H01L21/205 主分类号 H01L21/28
代理机构 代理人
主权项
地址