发明名称 MEMORY PROGRAM DISTURB REDUCTION
摘要 Some embodiments include a memory device and a method of programming memory cells of the memory device. One such method can include applying, during a first pass of programming, a first bias voltage value to a source select gate to isolate memory cells from a source, applying a programming voltage to an access line of a page of the memory cells during the first pass of programming, and applying a second bias voltage value to the source select gate to isolate the memory cells from the source during a second pass of programming. Further devices, systems, and methods are disclosed.
申请公布号 US2015170756(A1) 申请公布日期 2015.06.18
申请号 US201514632556 申请日期 2015.02.26
申请人 Micron Technology, Inc. 发明人 Goda Akira;Helm Mark;Kalavade Pranav;Srinivasan Charan
分类号 G11C16/34;G11C16/10;G11C16/04 主分类号 G11C16/34
代理机构 代理人
主权项 1. (canceled)
地址 Boise ID US