发明名称 IMPRINT LITHOGRAPHY TEMPLATE AND METHOD FOR ZERO-GAP IMPRINTING
摘要 <p>Imprint lithography templates having leading and trailing edge borders are provided that achieve zero-gap imprinting between adjacent fields with full-feature height features provided in the pattern exclusion zones (PEZ) located between such fields. The leading edge borders include dummy features, e.g., elongated features directionally oriented parallel to the mesa edge, while the trailing edge border includes a recess extending to the mesa edges. When used in a step-and-repeat process, the trailing edge border overlaps edge portions of an adjacent imprinted field that were previously patterned by the leading edge border of the template, producing full-feature height features in the pattern exclusion zones between such fields, and avoiding gaps or open areas between such fields that otherwise lead to non-uniformity of downstream processes such as etch processes and CMP.</p>
申请公布号 WO2015089158(A1) 申请公布日期 2015.06.18
申请号 WO2014US69500 申请日期 2014.12.10
申请人 CANON NANOTECHNOLOGIES, INC. 发明人 HAASE, GADDI S.;SELINIDIS, KOSTA;YE, ZHENGMAO
分类号 G03F7/00 主分类号 G03F7/00
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