发明名称 METHOD OF SIMULATION OF AN OPTOELECTRONIC DEVICE
摘要 A method of optical and electrical simulation of an optoelectronic device, the surface of which is intended to be illuminated has a texture formed of regular cones, under the effect of the illumination of the surface by an incident light beam having an intensity spectrum determined on the basis of the wavelength, the method being implemented by computer and comprising:;modelling the device in the form of a structure for which the illuminated surface is modelled by a planar surface, modelling the incident light beam by: a first light beam inclined relative to the normal to the surface with a first non-zero angle, simulating an angle of incidence of the incident beam on the texture of the surface of the device, and for which the intensity is equal to that of the incident beam. A second light beam is inclined relative to the normal to the surface with a second angle, simulating an angle of incidence of the reflected portion of the incident beam on the texture of the surface of the device, and it simulating the illumination of said surface by said first and second beams.
申请公布号 US2015169799(A1) 申请公布日期 2015.06.18
申请号 US201314411662 申请日期 2013.06.28
申请人 Commissariat à I'Energie Atomique et aux Energies Alternatives 发明人 Singer Julien;Brand Pierre;Thony Philippe
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项 1. A method for optical and electrical simulation of an optoelectronic device, the surface of which intended to be illuminated has a texture formed with regular cones, under the effect of the illumination of said surface by an incident light beam having a determined intensity spectrum versus wavelength, said method being applied by a computer and comprising: modeling the device as a structure for which the illuminated surface is modeled by a planar surface, modeling the incident light beam by: a first light beam tilted relatively to the normal to said surface with a first non-zero angle, simulating an angle of incidence of the incident beam on the texture of the surface of the device, and for which the intensity is equal to that of the incident beam, anda second light beam tilted relatively to the normal to said surface with a second angle, simulating an angle of incidence of the reflected portion of the incident beam on the texture of the surface of the device, simulating the illumination of the planar surface by said first and second light beams.
地址 Paris FR