发明名称 半導体装置の構造及びその製造方法
摘要 <p>First polysilicon (poly-1) is deposited into deep trenches that have been formed in a substrate. A first polysilicon polishing process is performed to planarize the exposed surfaces of the poly-1 so that the surfaces are flush with adjacent surfaces. Then, shallow trenches are formed in the substrate between the deep trenches, and second polysilicon (poly-2) is deposited into the shallow trenches. A second polysilicon polishing process is performed to planarize the exposed surface of the poly-2 so that the surface is flush with adjacent surfaces. Metal contacts to the poly-1 and the poly-2 are then formed.</p>
申请公布号 JP5736394(B2) 申请公布日期 2015.06.17
申请号 JP20120556225 申请日期 2011.03.02
申请人 发明人
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
代理机构 代理人
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