发明名称 Drive circuit for switching element
摘要 A drive circuit is used for driving a switching element. The drive circuit includes a detection unit and an integrated circuit. The detection unit detects a state of a controlled switching element and outputs a voltage signal corresponding to a detection result of the state. The integrated circuit receives the voltage signal via an input terminal for the detection result and controls the switching element based on the received voltage signal. The input terminal includes at least two input terminals that are connected to each other so as to receive the same voltage signal from the detection unit.
申请公布号 US9059706(B2) 申请公布日期 2015.06.16
申请号 US201213406948 申请日期 2012.02.28
申请人 DENSO CORPORATION 发明人 Miyauchi Syun;Maebara Tsuneo;Hamanaka Yoshiyuki;Miura Ryotaro
分类号 H02H7/08;H03K17/18;H03K17/082 主分类号 H02H7/08
代理机构 Nixon & Vanderhye P.C. 代理人 Nixon & Vanderhye P.C.
主权项 1. A drive circuit for driving a switching element, comprising: a detection unit that detects a state of a switching element targeted for being driven and outputs a voltage signal corresponding to a detection result of the state; and an integrated circuit that receives the voltage signal via an input terminal for the detection result and performs drive control of the switching element based on the received voltage signal, the input terminal including at least two input terminals that are connected to each other so as to receive the same voltage signal from the detection unit, wherein: the integrated circuit includes: a judgment unit that judges whether or not an abnormality of driving of the switching element occurs based on the same voltage single inputted via the at least two input terminals; anda restriction unit that restricts driving of the switching element, if the judgment unit judges that the abnormality occurs; the detection unit includes a constant current source that is located at the outside of the integrated circuit, and a temperature sense diode that is located in the vicinity of the switching element; and the judgment unit judges that an abnormality occurs in the switching element, if an anode voltage of the temperature sense diode is a predetermined threshold voltage or less.
地址 Kariya JP