| 发明名称 |
MEASURING METHOD OF UTILIZATION DEPTH OF ACTIVE MATERIAL, MANUFACTURING METHOD OF LITHIUM SECONDARY BATTERY, AND THE LITHIUM SECONDARY BATTERY |
| 摘要 |
A lithium secondary battery active material body is cut in a direction from a positive electrode to a negative electrode, a section is exposed, the section is smoothed, a Raman spectroscopic analysis is performed on the smooth section, and an utilization depth of active material of the lithium secondary battery active material body is measured. |
| 申请公布号 |
US2015159996(A1) |
申请公布日期 |
2015.06.11 |
| 申请号 |
US201414561865 |
申请日期 |
2014.12.05 |
| 申请人 |
SEIKO EPSON CORPORATION |
发明人 |
ICHIKAWA Sukenori;KAKEMURA Yasuto |
| 分类号 |
G01B11/06;H01M10/058;G01B11/22;H01M10/052 |
主分类号 |
G01B11/06 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A measuring method of an utilization depth of active material, comprising:
cutting a lithium secondary battery active material body in a direction from a positive electrode to a negative electrode; exposing a section; smoothing the section; performing a Raman spectroscopic analysis on the smooth section; and measuring the utilization depth of active material of the lithium secondary battery active material body. |
| 地址 |
Tokyo JP |
