发明名称 |
FORCE MEASUREMENT WITH REAL-TIME BASELINE DETERMINATION |
摘要 |
An atomic force microscope (AFM) and corresponding method to provide low force (sub-20 pN) AFM control and mechanical property measurement is provided. The preferred embodiments employ real-time false deflection correction/discrimination by adaptively modifying the drive ramp to accommodate to deflection artifacts. |
申请公布号 |
WO2015085316(A1) |
申请公布日期 |
2015.06.11 |
申请号 |
WO2014US69150 |
申请日期 |
2014.12.08 |
申请人 |
BRUKER NANO, INC. |
发明人 |
LIU, CHANGCHUN;PITTENGER, BEDE;HU, SHUIQING;SU, CHANMIN |
分类号 |
G01Q30/00 |
主分类号 |
G01Q30/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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