发明名称 |
RADIATION-SENSITIVE RESIN COMPOSITION, METHOD FOR FORMING RESIST PATTERN, POLYMER, COMPOUND AND PRODUCTION METHOD OF THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a radiation-sensitive resin composition excellent in LWR (line width roughness) performance, CD (critical dimension) uniformity, resolution, rectangularity in a cross-sectional shape, depth of focus, exposure latitude, and MEEF (mask error enhancement factor) performance.SOLUTION: The radiation-sensitive resin composition comprises a polymer having a structural unit expressed by formula (1) and a radiation-sensitive acid generator. In formula (1), Rrepresents a monovalent organic group containing a polar group. |
申请公布号 |
JP2015108809(A) |
申请公布日期 |
2015.06.11 |
申请号 |
JP20140209355 |
申请日期 |
2014.10.10 |
申请人 |
JSR CORP |
发明人 |
NAMAI HAYATO;NII NORIYUKI;OSAKI HITOMI |
分类号 |
G03F7/039;C07C67/14;C07C69/675;C07C69/732;C07C231/12;C07C235/06;C07C253/30;C07C255/20;C07D307/20;C07D307/33;C07D307/93;C07D317/40;C07D327/04;C07D407/12;C08F224/00;G03F7/004;G03F7/038 |
主分类号 |
G03F7/039 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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