An infrared thermographic inspection system (10) includes a heat source (12) configured to be removably attached to an exterior surface (28) of an object (26). A thermal imaging device (16) obtains a thermal image of the object (26), and an analyzing device (20) determines a location of a defect (24) in the object (26) based on the thermal image. The heat source (12) consists of a flexible polyimide heater (12) comprising a plurality of heating elements (42) which are independently controlled and the flexible heater can conform to the exterior surface (28) of the object (26).
申请公布号
WO2015084909(A1)
申请公布日期
2015.06.11
申请号
WO2014US68275
申请日期
2014.12.03
申请人
WATLOW ELECTRIC MANUFACTURING COMPANY
发明人
NOSRATI, MOHAMMAD;SWANSON, CAL;PTASIENSKI, KEVIN;SMITH, KEVIN, R.;STEINHAUSER, LOUIS, P.