发明名称 COPPER ELECTRODEPOSITION IN MICROELECTRONICS
摘要 <p>An electrolytic plating method and composition for electrolytically plating Cu onto a semiconductor integrated circuit substrate having submicron-sized interconnect features. The composition comprises a source of Cu ions and a suppressor compound comprising polyether groups. The method involves superfilling by rapid bottom-up deposition at a superfill speed by which Cu deposition in a vertical direction from the bottoms of the features to the top openings of the features is substantially greater than Cu deposition on the side walls.</p>
申请公布号 EP1810322(A4) 申请公布日期 2015.06.10
申请号 EP20050851560 申请日期 2005.11.14
申请人 ENTHONE INC. 发明人 PANECCASIO, VINCENT;LIN, XUAN;FIGURA, PAUL;HURTUBISE, RICHARD
分类号 H01L21/288;C25D3/38;C25D7/12;H01L21/768 主分类号 H01L21/288
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