INTERFEROMETRIC DETECTION METHOD

摘要

The present invention is an interferometric detection method which allows improving the limit of detection and taking interferometric measurements with a much higher degree of sensitivity than that allowed by interferometric devices known in the state of the art. The invention is characterized by the use of two interferometric measurements, a first reference measurement in a wavelength range and a second measurement on the observation region in at least the same wavelength range in which it is to be determined whether or not there are changes, where a quotient function, which is the function to be analyzed for establishing parameters determining the change experienced in the observation region with a high degree of sensitivity, is constructed from said measurements.