发明名称 半導体装置
摘要 <p>A semiconductor device includes an oxide semiconductor layer provided over a substrate having an insulating surface; a gate insulating film covering the oxide semiconductor layer; a first conductive layer and a second conductive layer laminated in this order over the gate insulating film; an insulating film covering the oxide semiconductor layer and a gate wiring including a gate electrode (the first and second conductive layers); and a third conductive layer and a fourth conductive layer laminated in this order over the insulating film and electrically connected to the oxide semiconductor layer. The gate electrode is formed using the first conductive layer. The gate wiring is formed using the first conductive layer and the second conductive layer. A source electrode is formed using the third conductive layer. A source wiring is formed using the third conductive layer and the fourth conductive layer.</p>
申请公布号 JP5732156(B2) 申请公布日期 2015.06.10
申请号 JP20140037934 申请日期 2014.02.28
申请人 发明人
分类号 G09F9/30;G02F1/1368;H01L21/336;H01L29/786;H01L51/50;H05B33/26 主分类号 G09F9/30
代理机构 代理人
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