Methods, systems, and articles of manufacture for implementing pattern-based design enabled manufacturing of electronic circuit designs

摘要

Some embodiments correlate various manufacturing or design information or data with patterns used to represent electronic designs and provide pertinent pattern-based information to metrology, fabrication, or testing tools to enhance their performances of their intended functions. Some embodiments further utilize cross-design or cross-process analytics to perform various pattern-based analysis on electronic designs. Some embodiments perform squish analysis with a squish pattern library on an electronic design to represent the electronic design with squish patterns by performing pattern matching, pattern decomposition, and pattern classification process.

主权项

1. A computer implemented method for performing pattern classification on an electronic design, comprising:
at least one processor or at least one processor core executing a process, the process comprising: profiling at least a portion of an electronic design against a pattern library including a plurality of patterns to determine a remaining region in the at least a portion of the electronic design; and identifying a new pattern for storage in the pattern library by at least performing the pattern classification on the remaining region, wherein the new pattern comprises a data structure having multiple binary values.