发明名称 Semiconductor device
摘要 A semiconductor device includes a semiconductor substrate of a first conductivity type, a first region of a second conductivity type formed in the semiconductor substrate, a second region of the first conductivity type formed in the first region, a source region of the second conductivity type formed in the second region, a drain region of the second conductivity type formed in the first region, a first junction part including a part of a border between the first region and the second region, which is on the side of the drain region, a second junction part including a part of the border between the first region and the second region, which is at a location different from the first junction part, a gate electrode formed above the first junction, and a conductor pattern formed above the second junction part and being electrically independent from the gate electrode.
申请公布号 US9054185(B2) 申请公布日期 2015.06.09
申请号 US201313915088 申请日期 2013.06.11
申请人 FUJITSU SEMICONDUCTOR LIMITED 发明人 Onoda Michihiro
分类号 H01L29/66;H01L29/78;H01L29/06;H01L29/40;H01L27/092;H01L29/08;H01L29/10;H01L21/8238 主分类号 H01L29/66
代理机构 Westerman, Hattori, Daniels & Adrian, LLP 代理人 Westerman, Hattori, Daniels & Adrian, LLP
主权项 1. A semiconductor device comprising: a semiconductor substrate of a first conductivity type; a first region of a second conductivity type opposite to the first conductivity type formed in the semiconductor substrate; a second region of the first conductivity type formed in the first region; a source region of the second conductivity type formed in the second region; a drain region of the second conductivity type formed in the first region; a first junction part that includes a part of a border between the first region and the second region, and that is on the side of the drain region; a second junction part that includes a part of the border between the first region and the second region, and that is at a location different from the first junction part; a device isolation insulation film formed in the semiconductor substrate and located on the second junction part; a gate electrode formed above the first junction; and a conductor pattern formed on the device isolation insulation film and being electrically independent from the gate electrode, the source region and the drain region.
地址 Yokohama JP