发明名称 |
Pattern modification with a preferred position function |
摘要 |
A method for pattern modification for making an integrated circuit layout is disclosed. The method includes determining a feature within a pattern of the integrated circuit layout that can be rearranged; determining a range in which the feature can be repositioned; for the feature, determining a preferred position function that exhibits extreme values at preferable positions; and rearranging the position of the feature within the range to match an extreme value of the function. |
申请公布号 |
US9053279(B2) |
申请公布日期 |
2015.06.09 |
申请号 |
US201314059210 |
申请日期 |
2013.10.21 |
申请人 |
Taiwan Semiconductor Manufacturing Company, Ltd. |
发明人 |
Chang Shih-Ming;Hsieh Ken-Hsien |
分类号 |
G06F17/50;H01L23/528;H01L21/027 |
主分类号 |
G06F17/50 |
代理机构 |
Haynes and Boone, LLP |
代理人 |
Haynes and Boone, LLP |
主权项 |
1. A method for pattern modification for making an integrated circuit layout, the method comprising:
identifying a set of features within a pattern of the integrated circuit layout, the set of features including a first feature that is at a first distance from a second feature of the set of features; determining a range over which the first feature is repositionable according to a functional constraint; for the set of features, determining a specified distance; and repositioning the first feature within the range to a new position that is at a second distance from the second feature, the second distance being closer to an integer multiple of the specified distance than the first distance. |
地址 |
Hsin-Chu TW |