发明名称 Pattern modification with a preferred position function
摘要 A method for pattern modification for making an integrated circuit layout is disclosed. The method includes determining a feature within a pattern of the integrated circuit layout that can be rearranged; determining a range in which the feature can be repositioned; for the feature, determining a preferred position function that exhibits extreme values at preferable positions; and rearranging the position of the feature within the range to match an extreme value of the function.
申请公布号 US9053279(B2) 申请公布日期 2015.06.09
申请号 US201314059210 申请日期 2013.10.21
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Chang Shih-Ming;Hsieh Ken-Hsien
分类号 G06F17/50;H01L23/528;H01L21/027 主分类号 G06F17/50
代理机构 Haynes and Boone, LLP 代理人 Haynes and Boone, LLP
主权项 1. A method for pattern modification for making an integrated circuit layout, the method comprising: identifying a set of features within a pattern of the integrated circuit layout, the set of features including a first feature that is at a first distance from a second feature of the set of features; determining a range over which the first feature is repositionable according to a functional constraint; for the set of features, determining a specified distance; and repositioning the first feature within the range to a new position that is at a second distance from the second feature, the second distance being closer to an integer multiple of the specified distance than the first distance.
地址 Hsin-Chu TW