发明名称 |
Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressure |
摘要 |
Ion guides for use in mass spectrometry (MS) systems are described. The ion guides are configured to provide a reflective electrodynamic field and a direct current (DC or static) electric field to provide ion beams that are more spatially confined with a comparatively large mass range. Some ion guides are provided between the ion source and the first stage vacuum chamber of the MS system. |
申请公布号 |
US9053915(B2) |
申请公布日期 |
2015.06.09 |
申请号 |
US201213626698 |
申请日期 |
2012.09.25 |
申请人 |
Agilent Technologies, Inc. |
发明人 |
Ristroph Trygve;Perelman Gershon |
分类号 |
H01J49/06 |
主分类号 |
H01J49/06 |
代理机构 |
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代理人 |
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主权项 |
1. A mass spectrometer having an inlet that is maintained, at a first pressure and a region that is maintained at a second pressure that is less than the first pressure, the inlet configured to receive an ion guide, wherein the ion guide comprises:
a substrate comprising a plurality of electrodes disposed thereover, the substrate forming a first opening at a first end and a second opening at a second end, wherein the first opening is configured to receive ions at the first pressure; a plurality of trenches provided in the substrate, wherein each of the plurality of trenches is provided between a respective adjacent pair of the plurality of electrodes; means for applying a radio frequency (RF) voltage between adjacent pairs of the plurality of electrodes, wherein the RF voltage creates a field in a region defined by the substrate; and means for applying a direct current (DC) voltage drop along a length of each of the plurality of electrodes. |
地址 |
Santa Clara CA US |