发明名称 Radio frequency (RF) ion guide for improved performance in mass spectrometers at high pressure
摘要 Ion guides for use in mass spectrometry (MS) systems are described. The ion guides are configured to provide a reflective electrodynamic field and a direct current (DC or static) electric field to provide ion beams that are more spatially confined with a comparatively large mass range. Some ion guides are provided between the ion source and the first stage vacuum chamber of the MS system.
申请公布号 US9053915(B2) 申请公布日期 2015.06.09
申请号 US201213626698 申请日期 2012.09.25
申请人 Agilent Technologies, Inc. 发明人 Ristroph Trygve;Perelman Gershon
分类号 H01J49/06 主分类号 H01J49/06
代理机构 代理人
主权项 1. A mass spectrometer having an inlet that is maintained, at a first pressure and a region that is maintained at a second pressure that is less than the first pressure, the inlet configured to receive an ion guide, wherein the ion guide comprises: a substrate comprising a plurality of electrodes disposed thereover, the substrate forming a first opening at a first end and a second opening at a second end, wherein the first opening is configured to receive ions at the first pressure; a plurality of trenches provided in the substrate, wherein each of the plurality of trenches is provided between a respective adjacent pair of the plurality of electrodes; means for applying a radio frequency (RF) voltage between adjacent pairs of the plurality of electrodes, wherein the RF voltage creates a field in a region defined by the substrate; and means for applying a direct current (DC) voltage drop along a length of each of the plurality of electrodes.
地址 Santa Clara CA US