| 发明名称 |
APPARATUS FOR FUNCTION TEST OF INTELLIGENT ELECTRONIC DEVICE(IED) IN SUBSTATION AUTOMATION SYSTEM BASED ON IEC61850 |
| 摘要 |
<p>The present invention relates to a simulator for an intelligent electronic device (IED) function test capable of automatically performing a general function test for an IED, a relaying characteristic function test, etc. through a script and determining a test result in a short time. The simulator comprises a script editor, a first application program interface (API) module, a second API module, a protocol analyzer, and a test result comparator.</p> |
| 申请公布号 |
KR20150062594(A) |
申请公布日期 |
2015.06.08 |
| 申请号 |
KR20130147413 |
申请日期 |
2013.11.29 |
| 申请人 |
KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE |
发明人 |
LEE, WON TAE;OH, SANG KI;RIM, SEONG JEONG;LEE, YONG JUN |
| 分类号 |
G01R31/28 |
主分类号 |
G01R31/28 |
| 代理机构 |
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