发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To dynamically change an intermittent interval of operation of a DLL circuit.SOLUTION: A semiconductor device comprises: a phase comparator circuit 14R which outputs a control signal CNTDIRR on the basis of phase comparison results of an external clock signal CK and an internal clock signal RCLK; a detection circuit 103R which detects whether the control signal CNTDIRR continuously holds a first value for a predetermined period or longer; enable signal generation circuits 101R and 102R which change a cycle at which an enable signal UDER is generated on the basis of detection results of the detection circuit 103R; delay amount update circuits 12, 10R, 10F.. which update a delay amount of an internal clock signal RCLK on the basis of the control signal CNTDIRR and the enable signal UDER. An intermittent interval of operation of the delay amount update circuit is automatically changed, so setting signals from the outside are unnecessary.
申请公布号 JP2015106720(A) 申请公布日期 2015.06.08
申请号 JP20130246225 申请日期 2013.11.28
申请人 MICRON TECHNOLOGY INC 发明人 ABE TSUNEO
分类号 H03L7/081;H03K5/135;H03L7/00 主分类号 H03L7/081
代理机构 代理人
主权项
地址