发明名称 |
SOURCE/DRAIN CONTACTS FOR NON-PLANAR TRANSISTORS |
摘要 |
The present description relates to the field of fabricating microelectronic devices having non-planar transistors. Embodiments of the present description relate to the formation of source/drain contacts within non-planar transistors, wherein a titanium-containing contact interface may be used in the formation of the source/drain contact with a discreet titanium silicide formed between the titanium-containing interface and a silicon-containing source/drain structure. |
申请公布号 |
US2015155385(A1) |
申请公布日期 |
2015.06.04 |
申请号 |
US201514618414 |
申请日期 |
2015.02.10 |
申请人 |
INTEL CORPORATION |
发明人 |
Pradhan Sameer S.;Joshi Subhash M.;Chun Jin-Sung |
分类号 |
H01L29/78;H01L29/45;H01L21/3205;H01L29/16;H01L21/02;H01L21/283;H01L29/66;H01L29/417 |
主分类号 |
H01L29/78 |
代理机构 |
|
代理人 |
|
主权项 |
1. A microelectronic device, comprising:
a silicon-containing non-planar transistor fin; a source/drain region in the silicon-containing non-planar fin; a source/drain contact adjacent the source/drain region, wherein the source/drain contact comprises a conductive contact material and a titanium-containing contact interface layer disposed between conductive contact material and the source/drain region; and a titanium silicide interface disposed between the source/drain region and the titanium-containing contact interface layer. |
地址 |
Santa Clara CA US |