发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 To improve productivity of a transistor that includes an oxide semiconductor and has good electrical characteristics. In a top-gate transistor including a gate insulating film and a gate electrode over an oxide semiconductor film, a metal film is formed over the oxide semiconductor film, oxygen is added to the metal film to form a metal oxide film, and the metal oxide film is used as a gate insulating film. After an oxide insulating film is formed over the oxide semiconductor film, a metal film may be formed over the oxide insulating film. Oxygen is added to the metal film to form a metal oxide film and added also to the oxide semiconductor film or the oxide insulating film.
申请公布号 US2015155312(A1) 申请公布日期 2015.06.04
申请号 US201514619310 申请日期 2015.02.11
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 Yamazaki Shunpei
分类号 H01L27/12;H01L29/36;H01L29/04;H01L29/786 主分类号 H01L27/12
代理机构 代理人
主权项 1. (canceled)
地址 Atsugi-shi JP