发明名称 |
MAGNETIC DISK INSPECTION DEVICE AND MAGNETIC DISK INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To further improve an accuracy of defect marking position with respect to an actual defect position on a magnetic disk of a magnetic disk inspection device and an inspection method. ! SOLUTION: A magnetic disk inspection device 5 performs: primary inspection of writing and reading test data by spirally scanning an entire surface of a magnetic disk 1 with a first write head 3 and a read head 4b to detect a defect site; and then secondary inspection of concentrically scanning a near-field region including the defect site detected by the primary inspection with the first write head 3 and the read head 4b to again detect a defect site. When both defect sites detected by the primary inspection and the secondary inspection coincide with each other, a magnetic signal is marked on the defect site using a second write head 4a. ! COPYRIGHT: (C)2015,JPO&INPIT |
申请公布号 |
JP2015103261(A) |
申请公布日期 |
2015.06.04 |
申请号 |
JP20130241085 |
申请日期 |
2013.11.21 |
申请人 |
HITACHI HIGH-TECH FINE SYSTEMS CORP |
发明人 |
SAKATA MASANOBU ; KATO YOJI ; ISHII TAKAO |
分类号 |
G11B5/84;G11B5/00;G11B5/455;G11B20/18 |
主分类号 |
G11B5/84 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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