发明名称 測定装置および測定方法
摘要 <p><P>PROBLEM TO BE SOLVED: To measure a waveform of the physical quantity of a measurement target as a smooth waveform while ensuring reliability of measurement. <P>SOLUTION: A measuring method includes executing primary correction processing, physical quantity generation processing and primary added physical quantity generation processing. In the primary correction processing, while alternately switching a gain of feedback control to G andα×G for evaluation regarding the gain, during a period in which the gain is G, a primary addition voltage V13 is added to a reference voltage V4a and during a period in which the gain isα×G, a reference voltage V4b is outputted as a primary correction reference voltage V11 as it is. In the physical quantity generation processing, the primary addition voltage V13 is multiplied by 1/(α-1), and a secondary addition voltage V16 is generated and added to the primary correction reference voltage V11 to generate an equivalent AC voltage V17 which is equivalent with an AC voltage V1. In the primary addition physical quantity generation processing, the primary addition voltage V13 is generated by attenuating the reference voltage V4 in such a manner that a detection voltage V14 becomes closer to zero volt, the detection voltage V14 being obtained by performing synchronous detection on the primary correction reference voltage V11. <P>COPYRIGHT: (C)2013,JPO&INPIT</p>
申请公布号 JP5726658(B2) 申请公布日期 2015.06.03
申请号 JP20110155302 申请日期 2011.07.14
申请人 发明人
分类号 G01D21/00;G01R19/00 主分类号 G01D21/00
代理机构 代理人
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