发明名称 品質評価装置、品質評価方法及び評価用基板
摘要 In a quality evaluation method, an evaluation substrate that includes a mounting region, in which a multilayer capacitor is to be mounted, in a center portion of the evaluation substrate is fixed in place using a plurality of fixed portions at corner portions of the evaluation substrate, each of which is a same distance from the mounting region. A voltage is applied to the multilayer capacitor mounted on the mounting region of the evaluation substrate. Sound is collected using a microphone that is near the multilayer capacitor mounted on the evaluation substrate.
申请公布号 JP5729363(B2) 申请公布日期 2015.06.03
申请号 JP20120188773 申请日期 2012.08.29
申请人 株式会社村田製作所 发明人 服部 和生;藤本 力;山田 忠輝
分类号 H01G13/00;H01G2/06 主分类号 H01G13/00
代理机构 代理人
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