发明名称 Semiconductor memory device and control method of the same
摘要 A semiconductor memory device includes a plurality of memory cells and a control circuit configured to apply a program voltage of an initial level to a control electrode of a selected memory cell and then of an increased level a number of times, each time without decreasing the program voltage applied to the control electrode, prior to executing a program verifying operation on the selected memory cell. In addition, the control circuit may further be configured to apply an erase voltage of an initial level to a control electrode of a selected memory cell and then of an increased level a number of times, each time without decreasing the erase voltage applied to the control electrode, prior to executing an erase verifying operation on the selected memory cell.
申请公布号 US9047962(B2) 申请公布日期 2015.06.02
申请号 US201313786003 申请日期 2013.03.05
申请人 Kabushiki Kaisha Toshiba 发明人 Ishii Hiroyuki
分类号 G11C16/34;G11C16/10;G11C16/12;G11C16/14;G11C16/04 主分类号 G11C16/34
代理机构 Patterson & Sheridan, LLP 代理人 Patterson & Sheridan, LLP
主权项 1. A semiconductor memory device, comprising: a plurality of memory cells; and a control circuit configured to apply a program voltage of an initial level to a first line electrically connected to a control electrode of a selected memory cell, and then of an increased level a number of times, each time without decreasing the program voltage applied to the first line, and execute a first verifying operation to apply a voltage that is lower than the program voltage of the initial level to the first line when the program voltage has been increased a first number of times.
地址 Tokyo JP