发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR FORMING THE SAME |
摘要 |
A semiconductor device including a substrate having an active region and a field-plate region therein is disclosed. At least one trench-gate structure is in the substrate. The field-plate region is at a first side of the trench-gate structure. At least one source doped region is in the substrate at a second side opposite to the first side of the trench-gate structure. The source doped region adjoins the sidewall of the trench-gate structure. A drain doped region is in the substrate corresponding to the active region. The field-plate region is between the drain doped region and the trench-gate structure. An extending direction of length of the trench-gate structure is perpendicular to that of the drain doped region as viewed from a top-view perspective. |
申请公布号 |
US2015145026(A1) |
申请公布日期 |
2015.05.28 |
申请号 |
US201314089211 |
申请日期 |
2013.11.25 |
申请人 |
Vanguard International Semiconductor Corporation |
发明人 |
CHANG Jui-Chun;CHANG Hsiung-Shih |
分类号 |
H01L29/78;H01L21/762;H01L27/088;H01L29/66;H01L29/423;H01L29/40 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
1. A semiconductor device, comprising:
a substrate having an active region and a field-plate region in the active region; at least one trench-gate structure in the substrate, wherein the field-plate region is at a first side of the at least one trench-gate structure; at least one source doped region in the substrate at a second side opposite to the first side of the at least one trench-gate structure, wherein the at least one source doped region adjoins a sidewall of the at least one trench-gate structure; and a drain doped region in the substrate corresponding to the active region, wherein the field-plate region is between the drain doped region and the at least one trench-gate structure, and wherein an extending direction of a length of the at least one trench-gate structure is perpendicular to that of the drain doped region as viewed from a top-view perspective. |
地址 |
Hsinchu TW |