发明名称 寄生容量が低減されたSOIボディ・コンタクト型FETのための方法
摘要 <p>In one embodiment, the present invention provides a semiconductor device that includes a substrate including a semiconducting layer positioned overlying an insulating layer the semiconducting layer including a semiconducting body and isolation regions present about a perimeter of the semiconducting body; a gate structure overlying the semiconducting layer of the substrate, the gate structure present on a first portion on an upper surface of the semiconducting body; and a silicide body contact that is in direct physical contact with a second portion of the semiconducting body that is separated from the first portion of the semiconducting body by a non-silicide semiconducting region.</p>
申请公布号 JP5723546(B2) 申请公布日期 2015.05.27
申请号 JP20100155374 申请日期 2010.07.08
申请人 发明人
分类号 H01L29/786;H01L21/336;H01L21/768;H01L23/522 主分类号 H01L29/786
代理机构 代理人
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