| 发明名称 |
MEASUREMENT SYSTEM OF A LIGHT SOURCE IN SPACE |
| 摘要 |
<p>A system measures the position of a light source in space using an imager and transparent surface with a pattern on top. The pattern consists of a repetitive pattern and a distinctive element. The system achieves sub-micron precision. It also handles the measurement of several light sources simultaneously, and the measurement of the position of a retroreflector instead of the light.</p> |
| 申请公布号 |
EP2593755(B1) |
申请公布日期 |
2015.05.27 |
| 申请号 |
EP20110749753 |
申请日期 |
2011.07.14 |
| 申请人 |
CSEM CENTRE SUISSE D'ELECTRONIQUE ET DE MICROTECHNIQUE SA - RECHERCHE ET DÉVELOPPEMENT |
发明人 |
GRENET, ERIC;MASA, PETER;FRANZI, EDOARDO;HASLER, DAVID |
| 分类号 |
G01D5/34;G01C3/08;G01S3/783 |
主分类号 |
G01D5/34 |
| 代理机构 |
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代理人 |
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