| 发明名称 | Method and apparatus for tuning an electrostatic ion trap | ||
| 摘要 | An apparatus includes an electrostatic ion trap and electronics configured to measure parameters of the ion trap and configured to adjust ion trap settings based on the measured parameters. A method of tuning the electrostatic ion trap includes, under automatic electronic control, measuring parameters of the ion trap and adjusting ion trap settings based on the measured parameters. | ||
| 申请公布号 | US9040907(B2) | 申请公布日期 | 2015.05.26 |
| 申请号 | US201214354227 | 申请日期 | 2012.10.30 |
| 申请人 | MKS Instruments, Inc. | 发明人 | Brucker Gerardo A.;Rathbone G. Jeffery;Horvath Brian J.;Swinney Timothy C.;Blouch Stephen C.;McCarthy Jeffrey G.;Piwonka-Corle Timothy R. |
| 分类号 | H01J49/42;H01J49/00;H01J49/14;H01J27/20 | 主分类号 | H01J49/42 |
| 代理机构 | Hamilton, Brook, Smith & Reynolds, P.C. | 代理人 | Hamilton, Brook, Smith & Reynolds, P.C. |
| 主权项 | 1. A method of tuning an electrostatic ion trap, the method comprising, under automatic electronic control: i) measuring parameters of the ion trap, the trap including an ion source having an electron source; ii) adjusting ion trap settings based on the measured parameters; and iii) employing the ion trap settings and producing test spectra from a test gas at a specified pressure. | ||
| 地址 | Andover MA US | ||