SYSTEMS AND METHODS FOR PRECISION OPTICAL IMAGING OF ELECTRICAL CURRENTS AND TEMPERATURE IN INTEGRATED CIRCUITS

摘要

Systems and methods for precision optical imaging of electrical currents and temperature in integrated circuits are disclosed herein. In one aspect of the disclosed subject matter, a method for detecting a characteristic of an integrated circuit can include depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit.

主权项

1. A method for detecting a characteristic of an integrated circuit, comprising:
depositing at least one diamond structure, having at least one color center therein, onto a side of the integrated circuit; applying an electromagnetic pump field to the at least one diamond structure; monitoring a spin state of the at least one color center by measuring an emission of photons from the at least one color center resulting from the electromagnetic pump field and an electromagnetic radiation of the integrated circuit; and detecting the characteristic of the integrated circuit based on a correlation between the emission of photons and the characteristic.