发明名称 |
INTEGRATED CIRCUIT AND INTERCONNECT, AND METHOD OF FABRICATING SAME |
摘要 |
The disclosure relates generally to integrated circuits (IC), IC interconnects, and methods of fabricating the same, and more particularly, high performance inductors. The IC includes at least one trench within a dielectric layer disposed on a substrate. The trench is conformally coated with a liner and seed layer, and includes an interconnect within. The interconnect includes a hard mask on the sidewalls of the interconnect. |
申请公布号 |
US2015140809(A1) |
申请公布日期 |
2015.05.21 |
申请号 |
US201514600273 |
申请日期 |
2015.01.20 |
申请人 |
International Business Machines Corporation |
发明人 |
DeMuynck David A.;He Zhong-Xiang;Miga Daniel R.;Moon Matthew D.;Vanslette Daniel S.;White Eric J. |
分类号 |
H01L21/768 |
主分类号 |
H01L21/768 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method of fabricating an interconnect in an integrated circuit, the method comprising:
conformally coating a trench with a liner and seed layer, the trench being within a dielectric layer disposed on a substrate; depositing a hard mask on the liner and seed layer; masking and patterning the trench to expose the hard mask; removing exposed areas of the hard mask to expose areas of the liner and seed layer; electrolytic metal plating the exposed areas of the liner and seed layer to form an interconnect; and planarizing the interconnect with a top surface of the trench. |
地址 |
Armonk NY US |