发明名称 METHOD FOR MANUFACTURING FIELD-EFFECT TRANSISTOR
摘要 <p>PROBLEM TO BE SOLVED: To provide a method for manufacturing a field-effect transistor by which an asymmetric recess structure can be introduced in a simple and convenient method without sacrificing the productivity.SOLUTION: A field-effect transistor has an asymmetric recess structure, and comprises a buffer layer 2, a channel layer 3, a barrier layer 4, a passivation layer 5, a first ohmic cap layer 6 and a second ohmic cap layer 7 which are stacked on a semiconductor crystal substrate 1 in this order. In the field-effect transistor, the barrier layer 4 includes a carrier-supply layer 8. The field-effect transistor has: the ohmic cap layers 6 and 7 composed of at least two kinds of semiconductor layers; a drain electrode-side recess region 13 making a recess region between a gate electrode 11 and a drain electrode 10; and a source electrode-side recess region 12 making a recess region between the gate electrode 11 and a source electrode 9. The drain electrode-side recess region 13 is larger than the source electrode-side recess region 12. A stepped portion of the ohmic cap layers 6 and 7 in a drain electrode-side termination part of the drain electrode-side recess region 13 is formed by at least two kinds of semiconductor layers.</p>
申请公布号 JP2015097225(A) 申请公布日期 2015.05.21
申请号 JP20130236471 申请日期 2013.11.15
申请人 NIPPON TELEGR & TELEPH CORP <NTT> 发明人 MATSUZAKI HIDEAKI
分类号 H01L21/338;H01L21/28;H01L21/336;H01L29/41;H01L29/417;H01L29/423;H01L29/49;H01L29/778;H01L29/78;H01L29/812 主分类号 H01L21/338
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